The thickness of silicon compound castings or solder resist films can be measured. There are two different measurement methods here, spectral confocal and optical interferometry. Silicon compound castings can be measured by dispersive confocal measurement and by optical interferometry. The thickness of coloured soldermask can be measured by optical interferometry. Here optical interferometry will have some advantages over confocal as it will have a range of a few millimetres more. The measurement may require an additional 3d measuring device to adjust the distance to ensure that the dispersive confocal sensor always has a measurement signal. vert's dispersive confocal measurement sensor has many benefits.

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